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Estimation of leaf thickness with remote sensing

文献类型: 外文期刊

作者: Sui, Xueyan 1 ; Zhang, Xiaodong 1 ; Wang, Yong 1 ; Li, Shaokun 2 ;

作者机构: 1.Shandong Acad Agr Sci, Jinan 250100, Peoples R China

2.Chinese Acad Agr Sci, Inst Crop Sci, Minist Agr, Key Lab Crop Physiol & Prod, Beijing 100081, Peoples R China

3.Xinjiang Construct Crops, Key Lab Oasis Ecol Agr, Shihezi 832003, Peoples R China

关键词: Hyper-spectral;Parameter;Estimate;Leaf thickness

期刊名称:INFORMATION TECHNOLOGY APPLICATIONS IN INDUSTRY, PTS 1-4

ISSN: 1660-9336

年卷期: 2013 年 263-266 卷

页码:

收录情况: SCI

摘要: Leaf thickness is one important index of describing plant growing conditions. But the measurements now are all tedious and destructive. In order to carry out real-time, live, non-destructive testing of leaf thickness, the study took cotton leaves as the research object. The correlations of leaf thickness with reflectance, vegetable index and spectral figure index were analyzed separately. And then the cause of correlation was studied. Three regression models were set up with the 3 parameters which had high correlation with leaf thickness. Among these models, the highest relative error is 7.4%, and the RMSE is 0.051 mm. It is feasible to measure alive leaf thickness untouchably with Hyper spectrum.

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